Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6650129 | Method of testing semiconductor device | — | 2003-11-18 |
| 6636824 | Method of and apparatus for inspecting semiconductor device | Kouetsu Sawai, Masahiko Ikeno | 2003-10-21 |
TK
Toshiharu Katayama
Overall (2003): #38,841 of 273,478Top 15%
2
Patents 2003