Issued Patents 2003
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6617864 | High frequency probe for examining electric characteristics of devices | Akira Inoue, Takayuki Katoh, Takeshi Aso, Naofumi Iwamoto | 2003-09-09 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6617864 | High frequency probe for examining electric characteristics of devices | Akira Inoue, Takayuki Katoh, Takeshi Aso, Naofumi Iwamoto | 2003-09-09 |