Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6577972 | Sampling inspection managing system | Taichi Yanaru, Hirofumi Ohtsuka | 2003-06-10 |
| 6535778 | Process control method and process control apparatus | Hirofumi Ohtsuka, Taichi Yanaru | 2003-03-18 |