Issued Patents 2003
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6629042 | Testing system and testing method for structure | Wataru Yamagishi, Toshihiko Horiuchi, Kazuhiro Umekita, Yasuyuki Momoi | 2003-09-30 |
| 6608921 | Inspection of solder bump lighted with rays of light intersecting at predetermined angle | Hiroshi Ikeda | 2003-08-19 |
| 6575037 | Multiple degree of freedom vibration exciting apparatus and system | Yasuyuki Momoi, Toshihiko Horiuchi, Kazuhiro Umekita, Takao Konno, Masaharu Sugano +1 more | 2003-06-10 |