Issued Patents 2003
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6571364 | Semiconductor integrated circuit device with fault analysis function | Tokuya Osawa | 2003-05-27 |
| 6516431 | Semiconductor device | — | 2003-02-04 |
| 6504772 | Testing method and test apparatus in semiconductor apparatus | — | 2003-01-07 |