EF

Eiro Fujii

MC Minolta Co.: 2 patents #62 of 328Top 20%
Overall (2003): #68,981 of 273,478Top 30%
2
Patents 2003

Issued Patents 2003

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6529280 Three-dimensional measuring device and three-dimensional measuring method Akira Yahashi, Toshio Norita, Fumiya Yagi, Satoru Hirose, Takuto Joko +4 more 2003-03-04
6522412 Measuring system with improved method of reading image data of an object Toshio Norita, Makoto Miyazaki, Shigeaki Imai, Fumiya Yagi, Satoru Hirose 2003-02-18