SS

Steven J. Simmons

Micron: 1 patents #445 of 831Top 55%
📍 Fraser, MI: #3 of 10 inventorsTop 30%
🗺 Michigan: #1,670 of 6,370 inventorsTop 30%
Overall (2003): #113,677 of 273,478Top 45%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6613590 Yield based, in-line defect sampling method — 2003-09-02