Issued Patents 2003
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6656678 | Method for examination of a surface layer | Bernhard Wolf, Hans-Jurgen Gahle, Werner Baumann, Ralf Ehret, Mirko Lehmann | 2003-12-02 |
| 6642126 | Process for manufacturing a semiconductor wafer with passivation layer mask for etching with mechanical removal | — | 2003-11-04 |
| 6638743 | Method for measuring a state variable | Werner Baumann, Ralf Ehret, Mirko Lehmann, Hans-Jörg Gahle, Bernhard Wolf +3 more | 2003-10-28 |
| 6572748 | Reference electrode | Sigrun Herrmann, Heiner Kaden, Wolfram Oelssner | 2003-06-03 |