DS

David D. Siek

Micron: 2 patents #294 of 831Top 40%
📍 Boise, ID: #177 of 574 inventorsTop 35%
🗺 Idaho: #257 of 1,039 inventorsTop 25%
Overall (2003): #70,590 of 273,478Top 30%
2
Patents 2003

Issued Patents 2003

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6590817 6F2 DRAM array with apparatus for stress testing an isolation gate and method — 2003-07-08
6510533 Method for detecting or repairing intercell defects in more than one array of a memory device Tim Damon 2003-01-21