DC

Daniel P. Cram

Micron: 2 patents #294 of 831Top 40%
📍 Boise, ID: #177 of 574 inventorsTop 35%
🗺 Idaho: #257 of 1,039 inventorsTop 25%
Overall (2003): #71,532 of 273,478Top 30%
2
Patents 2003

Issued Patents 2003

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6624653 Method and system for wafer level testing and burning-in semiconductor components — 2003-09-23
6585097 Bladder based package control/singulation — 2003-07-01