Issued Patents 2003
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6552360 | Method and circuit layout for reducing post chemical mechanical polishing defect count | Chun-Lien Su, Chi-Yuan Chin, Ming-Shang Chen, Tsung-Hsien Wu | 2003-04-22 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6552360 | Method and circuit layout for reducing post chemical mechanical polishing defect count | Chun-Lien Su, Chi-Yuan Chin, Ming-Shang Chen, Tsung-Hsien Wu | 2003-04-22 |