CT

Chao-Chuan Tseng

MC Macronix International Co.: 1 patents #81 of 179Top 50%
📍 Baoshan, TW: #83 of 319 inventorsTop 30%
Overall (2003): #247,166 of 273,478Top 95%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6569695 Method for monitoring particles and defects on wafer surface and in process Shih-Yen Chen 2003-05-27