Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6642529 | Methods for the automated testing of reticle feature geometries | Clifford Takemoto, Satyendra Sethi | 2003-11-04 |
| 6563144 | Process for growing epitaxial gallium nitride and composite wafers | Eicke R. Weber, Yihwan Kim, Joachim Krüger | 2003-05-13 |