Issued Patents 2003
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6554921 | Quality control plasma monitor for laser shock processing | David Sokol, Craig T. Walters, Harold M. Epstein, Allan H. Clauer, Jeffrey L. Dulaney | 2003-04-29 |
| 6548782 | Overlay control for laser peening | Steven E. Dykes, Allan H. Clauer, Jeff L. Dulaney, David F. Lahrman | 2003-04-15 |
| 6512584 | Quality control for laser peening | Allan H. Clauer, David Sokol, Jeffrey L. Dulaney, Steven M. Toller | 2003-01-28 |