Issued Patents 2003
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6647348 | Latent defect classification system | — | 2003-11-11 |
| 6624048 | Die attach back grinding | — | 2003-09-23 |
| 6601008 | Parametric device signature | — | 2003-07-29 |
| 6598194 | Test limits based on position | Emery Sugasawara, W. Robert Daasch, James McNames, Daniel R. Bockelman, Kevin Cota | 2003-07-22 |
| 6532431 | Ratio testing | — | 2003-03-11 |