Issued Patents 2003
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6545763 | Method for measuring a thickness profile and a refractive index using white-light scanning interferometry and recording medium therefor | Seung-Woo Kim | 2003-04-08 |
GK
Gee-Hong Kim
Overall (2003): #222,396 of 273,478Top 85%
1
Patents 2003