JK

Jan Martijn Krans

FE Fei: 1 patents #1 of 23Top 5%
Overall (2003): #62,467 of 273,478Top 25%
2
Patents 2003

Issued Patents 2003

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6646261 SEM provided with a secondary electron detector having a central electrode 2003-11-11
6593584 Multi-beam lithography apparatus with mutually different beam limiting apertures Peter Christiaan Tiemeijer 2003-07-15