YM

Yumiko Miyano

KT Kabushiki Kaisha Toshiba: 1 patents #624 of 1,928Top 35%
Overall (2003): #84,009 of 273,478Top 35%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6647147 Method for measuring fine pattern, apparatus for measuring fine pattern, and record medium that can store therein program to measure fine pattern and can be read by using computer 2003-11-11