Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6642519 | Fine pattern inspection apparatus and method and managing apparatus and method of critical dimension scanning electron microscope device | — | 2003-11-04 |
| 6505195 | Classification of retrievable documents according to types of attribute elements | Kenji Satoh, Akitoshi Okumura | 2003-01-07 |