Issued Patents 2003
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6601203 | Test program generation system and test program generation method for semiconductor test apparatus | Yoshihiro Asano, Yoshiaki Kodashiro, Kinji Okabe | 2003-07-29 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6601203 | Test program generation system and test program generation method for semiconductor test apparatus | Yoshihiro Asano, Yoshiaki Kodashiro, Kinji Okabe | 2003-07-29 |