Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6665078 | System and method for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern in thin film magnetic disks and silicon wafers | Rusmin Kudinar | 2003-12-16 |
| 6624884 | Surface inspection tool | Wayne Isami Imaino, Anthony Juliana, Jr., Milton Russell Latta, Charles H. Lee, Wai Cheung Leung +2 more | 2003-09-23 |