Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6599764 | Isolation testing scheme for multi-die packages | Boon Jin Ang, Kar Keng Chua | 2003-07-29 |
| 6577157 | Fully programmable I/O pin with memory | Krishna Rangasayee | 2003-06-10 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6599764 | Isolation testing scheme for multi-die packages | Boon Jin Ang, Kar Keng Chua | 2003-07-29 |
| 6577157 | Fully programmable I/O pin with memory | Krishna Rangasayee | 2003-06-10 |