Issued Patents 2003
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6665627 | Method and apparatus for evaluating and correcting the tester derating factor (TDF) in a test environment | Sunil K. Jain | 2003-12-16 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6665627 | Method and apparatus for evaluating and correcting the tester derating factor (TDF) in a test environment | Sunil K. Jain | 2003-12-16 |