Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6668347 | Built-in self-testing for embedded memory | Anthony Babella, Patrick Chan, Thomas J. Shewchuk, Daniel Lee | 2003-12-23 |
| 6622269 | Memory fault isolation apparatus and methods | Nguyen N. Ngo | 2003-09-16 |