Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6656647 | Method for examining structures on a wafer | Guenther Gerstmeier, Frank Richter | 2003-12-02 |
| 6529031 | Integrated circuit configuration for testing transistors, and a semiconductor wafer having such a circuit configuration | Günter Gerstmeier | 2003-03-04 |