Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6618303 | Integrated circuit, test structure and method for testing integrated circuits | Arndt Gruber, Ralf Schneider, Bernhard Ruf | 2003-09-09 |
| 6556486 | Circuit configuration and method for synchronization | Herbert Benzinger, Ralf Schneider | 2003-04-29 |