Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6557130 | Configuration and method for storing the test results obtained by a BIST circuit | Hans-Jürgen Krasser | 2003-04-29 |
| 6535046 | Integrated semiconductor circuit with an increased operating voltage | Robert Kaiser, Helmut Schneider | 2003-03-18 |