DW

David Wallis

Infineon Technologies Ag: 1 patents #298 of 897Top 35%
SK Semiconductor 300 Gmbh & Co. Kg: 1 patents #1 of 7Top 15%
Overall (2003): #238,446 of 273,478Top 90%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6633379 Apparatus and method for measuring the degradation of a tool Michael Roesner, Manfred Schneegans 2003-10-14