PT

Pascal Tannhof

IBM: 2 patents #1,011 of 5,539Top 20%
📍 Meylan, FR: #4 of 63 inventorsTop 7%
Overall (2003): #48,618 of 273,478Top 20%
2
Patents 2003

Issued Patents 2003

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6622135 Method for detecting and classifying anomalies using artificial neural networks Gislain Imbert De Tremiolles, Erin Williams 2003-09-16
6523018 Neural chip architecture and neural networks incorporated therein Didier Louis, Andre Steimle 2003-02-18