Issued Patents 2003
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6643807 | Array-built-in-self-test (ABIST) for efficient, fast, bitmapping of large embedded arrays in manufacturing test | Jay G. Heaslip, Gary W. Maier, Timothy J. von Reyn | 2003-11-04 |