Issued Patents 2003
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6650580 | Method for margin testing | — | 2003-11-18 |
| 6542418 | Redundant memory array having dual-use repair elements | Patrick R. Hansen | 2003-04-01 |
| 6509778 | BIST circuit for variable impedance system | Steven Burns, Patrick R. Hansen, Harold Pilo | 2003-01-21 |
| 6510091 | Dynamic precharge decode scheme for fast DRAM | Harold Pilo | 2003-01-21 |