Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6661223 | Method of testing for response abnormalities in a magnetic sensor | Peter Cheng-I Fang, Christopher D. Keener, Kenneth Mackay | 2003-12-09 |
| 6538430 | Screening test for transverse magnetic-field excited noise in giant magnetoresistive heads | Chris Carrington, Peter C. Fang, Don Horne, Christopher D. Keener, Kenneth Mackay +1 more | 2003-03-25 |