Issued Patents 2003
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6526655 | Angled flying lead wire bonding process | Brian S. Beaman, Keith E. Fogel, Paul A. Lauro | 2003-03-04 |
| 6528984 | Integrated compliant probe for wafer level test and burn-in | Brian S. Beaman, Keith E. Fogel, Paul A. Lauro | 2003-03-04 |
| 6523255 | Process and structure to repair damaged probes mounted on a space transformer | Keith E. Fogel, Paul A. Lauro, Brian S. Beaman | 2003-02-25 |
| 6525551 | Probe structures for testing electrical interconnections to integrated circuit electronic devices | Brian S. Beaman, Keith E. Fogel, Paul A. Lauro, Eugene J. O'Sullivan | 2003-02-25 |