Issued Patents 2003
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6651197 | Method for determining the optimum locations for scan latches in a partial-scan IC built in self test system | Edward J. O'Neill | 2003-11-18 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6651197 | Method for determining the optimum locations for scan latches in a partial-scan IC built in self test system | Edward J. O'Neill | 2003-11-18 |