Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6670808 | Self reference eddy current probe, measurement system, and measurement method | Shridhar Champaknath Nath, Carl Lester, Thomas James Batzinger | 2003-12-30 |
| 6545467 | Contoured surface eddy current inspection system | Thomas James Batzinger, James P. Fulton, Lee C. Perocchi | 2003-04-08 |