Issued Patents 2003
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6621283 | Semiconductor device, method of testing the semiconductor device, and semiconductor integrated circuit | Yasurou Matsuzaki, Masao Nakano, Toshiya Uchida, Atsushi Hatakeyama, Kenichi Kawasaki | 2003-09-16 |