Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6614244 | Semiconductor device inspecting apparatus | Keizo Yamada, Takeo Ushiki, Tohru Tsujide | 2003-09-02 |
| 6559662 | Semiconductor device tester and semiconductor device test method | Keizo Yamada, Takeo Ushiki, Tohru Tsujide | 2003-05-06 |