NT

Naoya Takeuchi

TC Tokyo Seimitsu Co.: 1 patents #6 of 16Top 40%
Overall (2003): #150,760 of 273,478Top 60%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6519357 Appearance inspection machine and method for concurrently performing defect detection and classification 2003-02-11