Issued Patents 2003
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6646737 | Submicron dimensional calibration standards and methods of manufacture and use | Marco Tortonese, Ellen Laird, Bradley W. Scheer | 2003-11-11 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6646737 | Submicron dimensional calibration standards and methods of manufacture and use | Marco Tortonese, Ellen Laird, Bradley W. Scheer | 2003-11-11 |