Issued Patents 2003
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6614252 | Semiconductor test apparatus with reduced power consumption and heat generation | — | 2003-09-02 |
| 6566896 | Semiconductor testing apparatus | — | 2003-05-20 |
| 6567760 | Electro-optic sampling oscilloscope | Jun Kikuchi, Yoshiki Yanagisawa, Nobukazu Banjo, Yoshio Endou, Mitsuru Shinagawa +2 more | 2003-05-20 |
| 6512610 | Device and method for testing of multi-branch optical network | Takao Minami, Keiichi Shimizu, Koichi Shinozaki, Takamu Genji | 2003-01-28 |
| 6505312 | Integrated circuit tester | Yoshiki Yanagisawa, Chitomi Terayama, Takayuki Sugizaki | 2003-01-07 |