Issued Patents 2003
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6621289 | Method and test circuit for developing integrated circuit fabrication processes | — | 2003-09-16 |
| 6549458 | Non-volatile memory array using gate breakdown structures | Kameswara K. Rao, James Karp, Shahin Toutounchi, Michael J. Hart, Daniel Gitlin +3 more | 2003-04-15 |
| 6522582 | Non-volatile memory array using gate breakdown structures | Kameswara K. Rao, James Karp, Shahin Toutounchi, Michael J. Hart, Daniel Gitlin +3 more | 2003-02-18 |
| 6509739 | Method for locating defects and measuring resistance in a test structure | Leon Ly Nguyen, Narasimhan Vasudevan | 2003-01-21 |