DT

David F. Taylor

AT Agilent Technologies: 2 patents #72 of 574Top 15%
📍 Edinburgh, NJ: #1 of 2 inventorsTop 50%
Overall (2003): #70,484 of 273,478Top 30%
2
Patents 2003

Issued Patents 2003

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6601004 Method and apparatus for measuring parameters of an electronic system Alex Ballantyne 2003-07-29
6519281 Jitter measurement 2003-02-11