Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6671844 | Memory tester tests multiple DUT's per test site | Alan S. Krech, Jr., John M Freeseman, Edmundo De La Puente | 2003-12-30 |
| 6570397 | Timing calibration and timing calibration verification of electronic circuit testers | Romi Mayder, Noriyuki Sugihara, Andrew C. S. Tse | 2003-05-27 |