FM

Fidel Muradali

AT Agilent Technologies: 1 patents #174 of 574Top 35%
📍 Tokyo, CA: #127 of 216 inventorsTop 60%
Overall (2003): #227,701 of 273,478Top 85%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6587981 Integrated circuit with scan test structure Neal C. Jaarsma 2003-07-01