SS

Shinya Sato

AD Advantest: 3 patents #11 of 100Top 15%
Overall (2003): #21,750 of 273,478Top 8%
3
Patents 2003

Issued Patents 2003

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
6651179 Delay time judging apparatus Masatoshi Sato, Toshiyuki Okayasu 2003-11-18
6597753 Delay clock generating apparatus and delay time measuring apparatus Toshiyuki Okayasu 2003-07-22
6571353 Fail information obtaining device and semiconductor memory tester using the same 2003-05-27