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Nobusuke Seki

AD Advantest: 1 patents #34 of 100Top 35%
Overall (2003): #148,069 of 273,478Top 55%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6586924 Method for correcting timing for IC tester and IC tester having correcting function using the correcting method Toshiyuki Okayasu 2003-07-01