Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6360005 | Apparatus and method for microscopic inspection of articles | Meir Aloni, Amir Alon, Yair Eran, Yigal Katzir, Gideon Rosenfeld | 2002-03-19 |
IK
Itzhak Katz
Overall (2002): #200,660 of 266,432Top 80%
1
Patents 2002