Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6445206 | Method and apparatus for determining yield impacting tests at wafer level package level for semiconductor devices | Juan Ignacio Alonso Montull, Eliseo Ventura Sobrino Patino | 2002-09-03 |