Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6376836 | Disentangling sample topography and physical properties in scanning near-field microwave microscopy | Bokke Johannes Feenstra, David E. Steinhauer | 2002-04-23 |
| 6366096 | Apparatus and method for measuring of absolute values of penetration depth and surface resistance of metals and superconductors | Vladimir V. Talanov | 2002-04-02 |