Issued Patents 2002
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6436798 | MOSFET device | — | 2002-08-20 |
| 6368911 | Method for manufacturing a buried gate | — | 2002-04-09 |
| 6350626 | Method of testing electromigration lifetime | Donald Cheng | 2002-02-26 |
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6436798 | MOSFET device | — | 2002-08-20 |
| 6368911 | Method for manufacturing a buried gate | — | 2002-04-09 |
| 6350626 | Method of testing electromigration lifetime | Donald Cheng | 2002-02-26 |